Advantest 93k Tester Manual [verified]

#include "testmethod.hpp" #include "SharedUserInterface.h" class FunctionalTestWithPMU : public testmethod::TestMethod protected: string mPinList; double mSettleTime; protected: virtual void initialize() // Bind local variables to the SmarTest parameter UI addParameter("pinList", "string", &mPinList); addParameter("settleTime", "double", &mSettleTime); virtual void run() // 1. Initialize the functional burst ON_FIRST_INVOCATION DMM_MAIN_BCAST_ON; // 2. Route PMU to pins and measure current try PRIMARY_PRES_PIN_VEC.clear(); // Execute functional pattern burst FLUSH_AND_WAIT(); // Output results to the datalogger PUT_DATALOG_VALUE("Meas_Current", 1.25, "mA", TM::PASS); catch (Error& err) SET_ERROR_STATUS(err.to_string()); ; REGISTER_TESTMETHOD("FunctionalTestWithPMU", FunctionalTestWithPMU); Use code with caution. SmarTest 8 Java Test Method Template

Always write code to support concurrent site testing. Avoid hardcoding explicit arrays or assuming a single DUT is present. Use vectors and site-loops ( FOR_EACH_SITE ) to parallelize hardware execution.

Run lmutil lmstat -a in the Linux terminal to verify your Advantest license feature seats. DIB Interlock Open

You can browse the Online TDC if you have an active myAdvantest portal account. advantest 93k tester manual

Before applying power, you must create a Pin Configuration file. This matches your device's signal pins, power pins, and ground pins to the corresponding tester resources (e.g., DPS lines or digital channels). Levels and Timing Setup Define the voltage thresholds ( Vihcap V sub i h end-sub Vilcap V sub i l end-sub Vohcap V sub o h end-sub Volcap V sub o l end-sub ) and Device Power Supply (DPS) values.

Examine the system logs ( /var/opt/hp93000/... ) for thermal alarms, power supply drops, or communication drops between the workstation and the test head. Summary Reference Table Section to Look Up Target Objective Key Terms to Search in Manual SmarTest User Manual Writing a new test program Pin Config, Test Flow, Level Setup, Timing Equation Hardware Reference Designing a new DIB/Loadboard Mechanical Keep-outs, Pin Mapping, Max Current per Slot Test Method Manual Developing custom analog/digital tests STM API, RoutingEngine , User Test Method, Custom Binning Diagnostic Manual Fixing a channel failure diag software, Relay Test, Calibration Error Codes

Yes. All official Advantest manuals are DRM-free PDFs. You can load them onto an iPad or offline laptop. However, ensure you comply with your company’s IT export control policies. #include "testmethod

Establish the clock periods, edge placements, and drive/strobe windows for your test signals. 3. Working with Test Flows and Test Suites

The Ultimate Guide to the Advantest V93000 (93k) Tester: Manual, Architecture, and Programming

Every 93k test program requires four foundational building blocks to execute a test functional or parametric pass/fail sequence. Pin Configuration (.pin / Pin Layout) SmarTest 8 Java Test Method Template Always write

Import the test program binaries, pin configurations, levels, timing, and digital patterns.

Execute the diag software suite to check for faulty relays, blown fuses, or failing channels on specific PE cards.

The "manual" for a 93k system is split into several functional areas depending on your role: ADVANTEST CORPORATION V93000 Technical Documentation - Advantest

Advantest does not publish a single, unified "93k Tester Manual." Instead, the documentation is split into a massive library of modular PDFs and interactive help files. If you have access to a tester or an offline workstation, you can open this library via the ( olh command in the terminal).

Instead of creating massive linear pattern files that consume vector memory, utilize micro-instructions like MATCH loops, JUMP commands, and nested subroutines within your digital source files.